0
291views
Metal migration in interconnect.
0
0views

Metal migration or electro migration is the transport of metal ions through a conductor resulting from the passage of direct current. It is caused by a modification of the normally random diffusion process to a directional one caused by charge carriers. At high current densities, the aluminium atoms in a …

Create a free account to keep reading this post.

and 2 others joined a min ago.

Please log in to add an answer.