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Draw labelled diagram of defect management process. List any two characteristics of defect management process. OR Explain Defect Management Process.

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Describe Defect Management Process with neat & labelled diagram.

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Defect Management Process diagram :

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As shown in the above diagram the defect management process is divided into following tasks:

i). Defect Prevention - Implementation of techniques, methodology and standard processes to reduce the risk of defects.

ii).Deliverable Baseline - Establishment of milestones where deliverables will be considered complete and ready for further development work. When a deliverable is base lined, any further changes are controlled. Errors in a deliverable are not considered defects until after the deliverable is base lined.

iii).Defect Discovery -Identification and reporting of defects for development team acknowledgment. A defect is only termed discovered when it has been documented and acknowledged as a valid defect by the development team member(s) responsible for the component(s) in error.

iv). Defect Resolution - Work by the development team to prioritize, schedule and fix a defect, and document the resolution. This also includes notification back to the tester to ensure that the resolution is verified.

Characteristics of defect management process are :

  1. The primary goal is to prevent defects. Where this is not possible or practical, the goals are to both find the defect as quickly as possible and minimize the impact of the defect.

  2. The defect management process should be risk driven-- i.e., strategies, priorities, and resources should be based on the extent to which risk can be reduced.

  3. Defect measurement should be integrated into the software development process and be used by the project team to improve the process. In other words, the project staff, by doing their job, should capture information on defects at the source. It should not be done after-the-fact by people unrelated to the project or system

  4. As much as possible, the capture and analysis of the information should be automated.

  5. Defect information should be used to improve the process. This, in fact, is the primary reason for gathering defect information.

  6. Most defects are caused by imperfect or flawed processes. Thus to prevent defects, the process must be altered.

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