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Explain the construction and working of of Atomic Force Microscope. Compare AFM with scanning electron microscope
written 7.9 years ago by gravatar for vermavarsha432 vermavarsha432 • 1.0k modified 5.6 years ago by gravatar for sanketshingote sanketshingote • 100
advanced engineering physics
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written 7.8 years ago by gravatar for vermavarsha432 vermavarsha432 • 1.0k modified 7.7 years ago by gravatar for yashbeer yashbeer ★ 11k

AFM consists of microscope cantilever with a sharp tip (probe) at its end used to scan the specimen surface.

The cantilever is typically silicon or silicon nitride with the tip radius of curvature of the orders of nm. Basically, AFM is modified TEM in which limitations of TEM is overcomed. …

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